Utilization of Symmetry Properties for the Pattern Analysis of Mutually Coupled Patch Radiators
Date
1992
Authors
Gimersky, Martin
Bornemann, Jens
Journal Title
Journal ISSN
Volume Title
Publisher
Radioengineering
Abstract
The influence of mutual coupling effects on the radiation pattern of microstrip antennas is investigated by introducing symmetry properties in the surface current distributions. The standard method of moments is used, which requires only the upper half of three x— and y— direction offset patch radiators to be solved, while the symmetric lower half is incorporated after the determination of the current distribution. Furthermore, the Toeplitz symmetry of the impedance matrix is taken into account, and the singular value decomposition is used to invert the resulting non-square matrix in a numerically stable way. Both the symmetry property and the Toeplitz symmetry procedures reduce storage and CPU-time requirements in the analysis of broadside microstrip arrays. The pattern characteristics calculated with and without mutual coupling interactions are found to differ up to 10 dB in sideloge levels which clearly demonstrates that the pattern can be as severely affected by mutual coupling as the commonly investigated input impedance. The predicted results are in good agreement with measured data on single patches.
Description
The authors would like to thank the Satellite and Communications Systems Division of spar Aerospace Ltd., Quebec, Canada for providing the measured data presented in Fig. 3.
Keywords
Citation
Gimersky, M., & Bornemann, J. (1992). Utilization of symmetry properties for the pattern analysis of mutually coupled patch radiators. Radioengineering, 1(0), 11- 16.