Saturation of ion yield in 2,2,4,4-TMP in response to very highly ionizing radiation
| dc.contributor.author | Rosvick, Myron R. | en_US |
| dc.date.accessioned | 2024-08-15T17:41:48Z | |
| dc.date.available | 2024-08-15T17:41:48Z | |
| dc.date.copyright | 1990 | en_US |
| dc.date.issued | 1990 | |
| dc.degree.department | Department of Physics and Astronomy | |
| dc.degree.level | Master of Science M.Sc. | en |
| dc.description.abstract | The free ion yields in 2,2,4,4-tetramethylpentane with applied electric fields between 604 V / cm and 3625 V / cm and at three different energy depositions are found. These free ion yields are modelled using Onsager's initial recombination theory and Jaffe's column recombination theory. Onsager's theory is used to determine a voltage independent Birks factor of 0.178±0.014 cm/MeV. Voltage dependent Birks factors are also determined. | |
| dc.format.extent | 99 pages | |
| dc.identifier.uri | https://hdl.handle.net/1828/19523 | |
| dc.rights | Available to the World Wide Web | en_US |
| dc.title | Saturation of ion yield in 2,2,4,4-TMP in response to very highly ionizing radiation | en_US |
| dc.type | Thesis | en_US |
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