Magnetization dynamics in lithographically patterned Ni80Fe20/Ir20Mn80 exchange-biased square elements

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dc.contributor.authorXu, Haitian
dc.contributor.supervisorChoi, Byoung-Chul
dc.date.accessioned2012-08-27T21:08:12Z
dc.date.available2012-08-27T21:08:12Z
dc.date.copyright2012en_US
dc.date.issued2012-08-27
dc.degree.departmentDepartment of Physics and Astronomy
dc.degree.levelMaster of Science M.Sc.en_US
dc.description.abstractThe magnetic properties and crystal texture of micron-sized, lithographically patterned ferromagnetic/antiferromagnetic (FM/AF) exchange-coupled elements supporting vortex remanent magnetization states were characterized using experimental and numerical modeling techniques. 10umx10um square elements consisting of Ni80Fe20/Ir20Mn80 bilayers prepared on silicon and glass substrates using e-beam lithography and magnetron sputtering were thermomagnetically annealed under various in-plane cooling fields to induce exchange bias. Longitudinal and time-resolved Kerr effect microscopy were employed to measure the quasi-static hysteresis and dynamic response, while X-ray diffraction analysis was used to probe their crystal texture under different deposition and substrate conditions. The FM layer was found to be critical for the development of the necessary texture and spin alignment in the AF for creating interfacial exchange-bias. The exchange-bias field was found to significantly alter the magnetic behavior of the samples, leading to the stabilization of the vortex structure and asymmetric hysteresis loop shift in the quasi-static regime, as well as precessional frequency reduction of the bottom domain in the dynamic regime. Numerical simulations showed good qualitative agreement with both experimental observations and existing literature, and revealed the origin of the precessional frequency reduction as the different spin-wave eigenmodes excited by different remanent magnetization states.en_US
dc.description.scholarlevelGraduateen_US
dc.identifier.bibliographicCitationXu, H. et al., Journal of Magnetics, 16(2): 83-87, (2011)en_US
dc.identifier.bibliographicCitationXu, H. et al., IEEE Magnetics Lett., Vol.3, pp.3500204, (2012)en_US
dc.identifier.urihttp://hdl.handle.net/1828/4173
dc.languageEnglisheng
dc.language.isoenen_US
dc.rights.tempAvailable to the World Wide Weben_US
dc.subjectExchange-biasen_US
dc.subjectMagnetization dynamicsen_US
dc.subjectVortex magnetizationen_US
dc.subjectTime-resolved magnetic microscopyen_US
dc.subjectNumerical modelingen_US
dc.titleMagnetization dynamics in lithographically patterned Ni80Fe20/Ir20Mn80 exchange-biased square elementsen_US
dc.typeThesisen_US

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