Extracting the refractive index profile from near-field mode images of vertical-cavity surface-emitting lasers

dc.contributor.authorSalsbury, Marc
dc.contributor.supervisorGordon, Reuven
dc.date.accessioned2009-11-19T21:15:15Z
dc.date.available2009-11-19T21:15:15Z
dc.date.copyright2005en
dc.date.issued2009-11-19T21:15:15Z
dc.degree.departmentDepartment of Electrical and Computer Engineering
dc.degree.levelMaster of Applied Science M.A.Sc.en
dc.description.abstractIn this thesis, a novel method of imaging the near-field intensity patterns of a vertical-cavity surface-emitting laser (VCSEL) is presented. The method is to use an imaging spectrometer to separate closely spaced modes and to image a vertical slice of each profile. The images are then reconstructed to form a composite image. Based on the near-field image, the refractive index profile of the VCSEL is extracted. The method to extract the refractive index profile is based on a method derived from Maxwell's Equations and the Poynting Vector. The results of both the mode images and the refractive index profile are found to be in agreement with those obtained elsewhere.en
dc.identifier.urihttp://hdl.handle.net/1828/1874
dc.languageEnglisheng
dc.language.isoenen
dc.rightsAvailable to the World Wide Weben
dc.subjectsemiconductoren
dc.subjectlasersen
dc.subject.lcshUVic Subject Index::Sciences and Engineering::Engineering::Electrical engineeringen
dc.titleExtracting the refractive index profile from near-field mode images of vertical-cavity surface-emitting lasersen
dc.typeThesisen

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