Selective Probing of Thin Film Interfaces Using Internal Reflection Sum-Frequency Spectroscopy
| dc.contributor.author | Azam, Md. Shafiul | |
| dc.contributor.author | Cai, Canyu | |
| dc.contributor.author | Hore, Dennis K. | |
| dc.date.accessioned | 2019-12-18T22:42:25Z | |
| dc.date.available | 2019-12-18T22:42:25Z | |
| dc.date.copyright | 2019 | en_US |
| dc.date.issued | 2019 | |
| dc.description.abstract | The study of interfacial properties of thin films such as polymers is an important area of surface science. The application of visible–infrared sum-frequency generation spectroscopy to such systems requires a careful interpretation of the results, as the electric field magnitude and phase at each interface must be determined in a manner that takes thin-film interference effects into account. Several schemes have been proposed for handling the local field corrections, and these methods all have their origins in linear optics. We first provide an extensive discussion of the cases in which the film is sufficiently thick that multiple beam interference can be ignored or sufficiently thin in which the relevant expressions collapse to simple forms. Then, we illustrate a straightforward method that has a concise analytic solution in the case of a single thin film that exhibits interference effects. We demonstrate a visualization technique that allows the experimental geometry to be tuned to select the interface of interest and rapidly switch between the interfaces when the film thickness is chosen to accommodate this. | en_US |
| dc.description.reviewstatus | Reviewed | en_US |
| dc.description.scholarlevel | Faculty | en_US |
| dc.description.sponsorship | This work was supported by a Discovery Grant from the Natural Sciences and Engineering Research Council of Canada (NSERC), and an NSERC Collaborative Research and Discovery Grant in partnership with ASASoft (Canada) Inc. Equipment was purchased with support from the Canadian Foundation for Innovation and the British Columbia Knowledge Development Fund. Raman and profilometry measurements were performed at the University of Victoria Centre for Advanced Materials and Related Technologies (CAMTEC). Dr. Stanislav Konorov (UVic Chemistry) provided advice on the application of Raman spectroscopy to the thickness measurements. The authors thank Prof. Aaron Massari (University of Minnesota) and Prof. Sean Roberts (University of Texas at Austin) for stimulating discussions on the topic of multiple beam interference in SFG spectroscopy. The authors thank Prof. Akihiro Morita (Tohoku University) for valuable discussion on the topic of electric fields at interfaces. | en_US |
| dc.identifier.citation | Azam, M. S.; Cai, C.; & Hore, D. K. (2019). Selective probing of thin-film interfaces using internal reflection sum-frequency spectroscopy. The Journal of Physical Chemistry C, 123(38), 23535-23544. DOI: 10.1021/acs.jpcc.9b06761 | en_US |
| dc.identifier.uri | https://doi.org/10.1021/acs.jpcc.9b06761 | |
| dc.identifier.uri | http://hdl.handle.net/1828/11385 | |
| dc.language.iso | en | en_US |
| dc.publisher | The Journal of Physical Chemistry C | en_US |
| dc.subject | Thickness | en_US |
| dc.subject | Thin films | en_US |
| dc.subject | Interfaces | en_US |
| dc.subject | Nonlinear optics | en_US |
| dc.subject | Infrared light | en_US |
| dc.title | Selective Probing of Thin Film Interfaces Using Internal Reflection Sum-Frequency Spectroscopy | en_US |
| dc.type | Postprint | en_US |