Modified Geffe test pattern generator for built-in self-test
| dc.contributor.author | Qi, Dandan | |
| dc.contributor.supervisor | Muzio, Jon C. | |
| dc.date.accessioned | 2010-02-17T20:09:11Z | |
| dc.date.available | 2010-02-17T20:09:11Z | |
| dc.date.copyright | 2005 | en |
| dc.date.issued | 2010-02-17T20:09:11Z | |
| dc.degree.department | Department of Computer Science | |
| dc.degree.level | Master of Science M.Sc. | en |
| dc.description.abstract | Unlike linear Finite State Machines (FSM) such as Linear Feedback Shift Registers (LFSR), the Geffe generator, a nonlinear FSM, hasn't been frequently studied or used in the scenario of digital system testing. Such machines are used as pattern generators for built-in self-test. LFSRs have become widely used in today's integrated circuits since they have a comparatively low hardware overhead. While it is known that a Geffe generator when used as a pattern generator for a built-in self-test, gives improved fault detection, the area overhead is sufficiently high for this not to be a practical approach. In this thesis, we propose three possible redesigns of the Geffe generator, and these redesigns are analyzed on both theoretical grounds and experiments. Our results show that two of our redesigned machines lead to fault coverage that is comparable to the original Geffe generator, but with very sharply reduced area overhead. | en |
| dc.identifier.uri | http://hdl.handle.net/1828/2210 | |
| dc.language | English | eng |
| dc.language.iso | en | en |
| dc.rights | Available to the World Wide Web | en |
| dc.subject | generators | en |
| dc.subject | computer programs | en |
| dc.subject.lcsh | UVic Subject Index::Sciences and Engineering::Applied Sciences::Computer science | en |
| dc.title | Modified Geffe test pattern generator for built-in self-test | en |
| dc.type | Thesis | en |