Specimen preparation for nano-scale investigation of cementitious repair material

dc.contributor.authorAzarsa, Pejman
dc.contributor.authorGupta, Rishi
dc.date.accessioned2020-10-26T22:35:09Z
dc.date.available2020-10-26T22:35:09Z
dc.date.copyright2018en_US
dc.date.issued2018
dc.description.abstractCementitious Repair Materials (CRMs) in the construction industry have been used for many decades now and has become a very important part of activities in cement world. The performance of some of these CRMs when applied to retrofitting concrete structural elements is also well documented. However, the characterization of some of the CRMs at the micro- and nano level is not fully documented. The first step to studying materials at the microscopic level is to be able to fabricate proper specimens for microscopy. In this study, a special and newly developed class of CRM was selected and fabricated by Focused Ion Beam (FIB) using well-known “Lift-out” technique. The prepared specimen was later examined using various analytical techniques such as energy dispersive x-ray analysis using one of the highest and most stable Scanning Transmission Electron Holography Microscopy (STEHM) around the world. This process enabled understanding of the composition, morphology, and spatial distribution of various phases of the CRM. It was observed that the microstructure consisted of a very fine, compact, and homogenous amorphous structure. X-ray analysis indicated that there was considerable deviation between the Si/Ca ratios for the hydrated product.en_US
dc.description.reviewstatusRevieweden_US
dc.description.scholarlevelFacultyen_US
dc.description.sponsorshipThanks are due to the Natural Sciences and Engineering Research Council of Canada (NSERC) for financial support. The authors are grateful to Drs. Rodney Herring, Elaine Humphrey, Arthur Buckham, and Mana Norouzpour for first engaging their interest in the subject of cement, and for continued valuable discussion.en_US
dc.identifier.citationAzarsa, P. & Gupta, R. (2018). Specimen preparation for nano-scale investigation of cementitious repair material. Micron, 107, 43-54. https://doi.org/10.1016/j.micron.2018.01.007.en_US
dc.identifier.urihttps://doi.org/10.1016/j.micron.2018.01.007
dc.identifier.urihttp://hdl.handle.net/1828/12268
dc.language.isoenen_US
dc.publisherMicronen_US
dc.subjectSpecimen preparation
dc.subjectFocused ion beam
dc.subjectCementitious materials
dc.subjectScanning Transmission Electron Holography
dc.subjectMicroscopy (STEHM)
dc.subjectElectron diffraction pattern
dc.subject.departmentDepartment of Civil Engineering
dc.titleSpecimen preparation for nano-scale investigation of cementitious repair materialen_US
dc.typePostprinten_US

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