Fault detection in combinational networks using Reed-Muller and modified Reed-Muller spectral techniques
Date
1989
Authors
Liu, Victor Kai
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Abstract
The testing of digital circuits has become more difficult and more expensive with the increasing complexity and density of circuits. Many approaches to speeding up testing have been proposed, such as signature analysis and a number of different spectral techniques. In this research, we concentrate on spectral techniques for fault detection.
Reed-Muller (RM) coefficients have been used for canonical expressions for switching functions for a number of years. Recently two authors have proposed their use for fault detection. In this thesis, a further study of their effectiveness is undertaken and a new spectral technique for fault detection based on modified Reed-Muller (MRM) coefficients is developed. An analysis and derivation of the properities of MRM coefficients is given, and it is shown that the many of the Reed-Muller properties follow as special cases of the modified Reed-Muller results. A new matrix method to analyse the properities of Reed-Muller (RM) and modified Reed-Muller spectra is used which simplifies the analysis.
The detection of stuck-at and bridging faults is considered. The testability for stuck-at faults and input bridging faults by using Reed-Muller and modified Reed-Muller coefficients is examined. It is shown that for these faults, a test that is both simple and efficient can be found. A new testing method, constrained RM and MRM spectral testing, is proposed. Constrained Reed-Muller or modified Reed-Muller testing can make the detection of some internal stuck-at faults much easier. A fault simulation program is developed and used to examine a set of small circuits in detail and compare the various possible signatures.