Analysis of the new class of cellular automata and its application in VLSI testing
dc.contributor.author | Sun, Lin. | en_US |
dc.contributor.supervisor | Muzio, Jon C. | en_US |
dc.date.accessioned | 2008-04-10T05:56:51Z | |
dc.date.available | 2008-04-10T05:56:51Z | |
dc.date.copyright | 2003 | en_US |
dc.date.issued | 2008-04-10T05:56:51Z | |
dc.degree.department | Dept. of Computer Science | en_US |
dc.identifier.uri | http://hdl.handle.net/1828/408 | |
dc.subject.lcsh | Cellular automata | en_US |
dc.title | Analysis of the new class of cellular automata and its application in VLSI testing | en_US |
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