Test set generation using linear finite state machines

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dc.contributor.authorTian, Wanningen_US
dc.date.accessioned2024-08-15T20:09:25Z
dc.date.available2024-08-15T20:09:25Z
dc.date.copyright1997en_US
dc.date.issued1997
dc.degree.departmentDepartment of Computer Science
dc.degree.levelMaster of Science M.Sc.en
dc.description.abstractIn this thesis, we investigate the embedding of some deterministic test sets into se­quences generated by linear finite state machines. The performance of the machines is analyzed using simulation. An alternative approach using partitioning is also proposed. Our research shows that the embedding is possible. However, finding good machines is comparatively difficult. We suggest that some modifications to the linear finite state machines may solve the problem. We present an approach of partitioning the machines which reduces the length of the test sequence.
dc.format.extent123 pages
dc.identifier.urihttps://hdl.handle.net/1828/19911
dc.rightsAvailable to the World Wide Weben_US
dc.titleTest set generation using linear finite state machinesen_US
dc.typeThesisen_US

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